Anshuman Chandra, Rohit Kapur. Bounded Adjacent Fill for Low Capture Power Scan Testing. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA. pages 131-138, IEEE Computer Society, 2008. [doi]
@inproceedings{ChandraK08,
title = {Bounded Adjacent Fill for Low Capture Power Scan Testing},
author = {Anshuman Chandra and Rohit Kapur},
year = {2008},
doi = {10.1109/VTS.2008.47},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2008.47},
tags = {testing},
researchr = {https://researchr.org/publication/ChandraK08},
cites = {0},
citedby = {0},
pages = {131-138},
booktitle = {26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA},
publisher = {IEEE Computer Society},
}