Prashanth Chandran, Derek Bradley, Markus H. Gross, Thabo Beeler. Attention-Driven Cropping for Very High Resolution Facial Landmark Detection. In 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2020, Seattle, WA, USA, June 13-19, 2020. pages 5860-5869, IEEE, 2020. [doi]
Abstract is missing.