Unni Chandran, Dan Zhao. SS-KTC: A High-Testability Low-Overhead Scan Architecture with Multi-level Security Integration. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 321-326, IEEE Computer Society, 2009. [doi]
@inproceedings{ChandranZ09-0,
title = {SS-KTC: A High-Testability Low-Overhead Scan Architecture with Multi-level Security Integration},
author = {Unni Chandran and Dan Zhao},
year = {2009},
doi = {10.1109/VTS.2009.20},
url = {http://dx.doi.org/10.1109/VTS.2009.20},
tags = {architecture, testing, security},
researchr = {https://researchr.org/publication/ChandranZ09-0},
cites = {0},
citedby = {0},
pages = {321-326},
booktitle = {27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3598-2},
}