A maximum-likelihood detection scheme for rapid imaging of string-like samples in atomic force microscopy

Peter I. Chang, Sean B. Andersson. A maximum-likelihood detection scheme for rapid imaging of string-like samples in atomic force microscopy. In Proceedings of the 48th IEEE Conference on Decision and Control, CDC 2009, combined withe the 28th Chinese Control Conference, December 16-18, 2009, Shanghai, China. pages 8290-8295, IEEE, 2009. [doi]

Abstract

Abstract is missing.