High-Frequency EM Characterization of Through-Wall Building Imaging

Paul C. Chang, Robert J. Burkholder, John L. Volakis, Ronald J. Marhefka, Yakup Bayram. High-Frequency EM Characterization of Through-Wall Building Imaging. IEEE T. Geoscience and Remote Sensing, 47(5):1375-1387, 2009. [doi]

Abstract

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