An intelligent analysis of Iddq data for chip classification in very deep-submicron (VDSM) CMOS technology

Chia-Ling Chang, Chia-Ching Chang, Hui-Ling Chan, Charles H.-P. Wen, Jayanta Bhadra. An intelligent analysis of Iddq data for chip classification in very deep-submicron (VDSM) CMOS technology. In Proceedings of the 17th Asia and South Pacific Design Automation Conference, ASP-DAC 2012, Sydney, Australia, January 30 - February 2, 2012. pages 163-168, IEEE, 2012. [doi]

Abstract

Abstract is missing.