Kai-Hui Chang, Chia-Wei Chang, Jie-Hong Roland Jiang, Chien-Nan Jimmy Liu. Reducing test point overhead with don't-cares. In 55th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2012, Boise, ID, USA, August 5-8, 2012. pages 534-537, IEEE, 2012. [doi]
Abstract is missing.