A novel combinational testability analysis by considering signal correlation

Shih-Chieh Chang, Shi-Sen Chang, Wen-Ben Jone, Chien-Chung Tsai. A novel combinational testability analysis by considering signal correlation. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 658-667, IEEE Computer Society, 1998. [doi]

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