Determination of thermal resistance using Gummel measurement for InGaP/GaAs HBTs

Yang-Hua Chang, Hui-Fen Hsu. Determination of thermal resistance using Gummel measurement for InGaP/GaAs HBTs. Microelectronics Reliability, 46(12):2074-2078, 2006. [doi]

Authors

Yang-Hua Chang

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Hui-Fen Hsu

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