Yang-Hua Chang, Hui-Fen Hsu. Determination of thermal resistance using Gummel measurement for InGaP/GaAs HBTs. Microelectronics Reliability, 46(12):2074-2078, 2006. [doi]
@article{ChangH06-1,
title = {Determination of thermal resistance using Gummel measurement for InGaP/GaAs HBTs},
author = {Yang-Hua Chang and Hui-Fen Hsu},
year = {2006},
doi = {10.1016/j.microrel.2005.12.008},
url = {http://dx.doi.org/10.1016/j.microrel.2005.12.008},
researchr = {https://researchr.org/publication/ChangH06-1},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {46},
number = {12},
pages = {2074-2078},
}