Kuo-Hao Chang, Liam Y. Hsieh. Determination of Wafer Start Mix in Semiconductor Manufacturing During New Technology Ramp-Up: Model, Solution Method, and an Empirical Study. IEEE Transactions on Systems, Man, and Cybernetics, Part A, 46(2):294-302, 2016. [doi]
@article{ChangH16-1,
title = {Determination of Wafer Start Mix in Semiconductor Manufacturing During New Technology Ramp-Up: Model, Solution Method, and an Empirical Study},
author = {Kuo-Hao Chang and Liam Y. Hsieh},
year = {2016},
doi = {10.1109/TSMC.2015.2426174},
url = {http://dx.doi.org/10.1109/TSMC.2015.2426174},
researchr = {https://researchr.org/publication/ChangH16-1},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Systems, Man, and Cybernetics, Part A},
volume = {46},
number = {2},
pages = {294-302},
}