Determination of Wafer Start Mix in Semiconductor Manufacturing During New Technology Ramp-Up: Model, Solution Method, and an Empirical Study

Kuo-Hao Chang, Liam Y. Hsieh. Determination of Wafer Start Mix in Semiconductor Manufacturing During New Technology Ramp-Up: Model, Solution Method, and an Empirical Study. IEEE Transactions on Systems, Man, and Cybernetics, Part A, 46(2):294-302, 2016. [doi]

Abstract

Abstract is missing.