Huai-Chung Chang, Pei-Yu Huang, Ting-Jung Li, Yu-Min Lee. Statistical electro-thermal analysis with high compatibility of leakage power models. In Thomas Büchner, Ramalingam Sridhar, Andrew Marshall, Norbert Schuhmann, editors, Annual IEEE International SoC Conference, SoCC 2010, September 27-29, 2010, Las Vegas, NV, USA, Proceedings. pages 139-144, IEEE, 2010. [doi]
Abstract is missing.