An analytical model to estimate PCM failure probability due to process variations

Mu-Tien Chang, Bruce Jacob. An analytical model to estimate PCM failure probability due to process variations. In IEEE 24th International SoC Conference, SOCC 2011, Taipei, Taiwan, September 26-28, 2011. pages 174-177, IEEE, 2011. [doi]

Authors

Mu-Tien Chang

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Bruce Jacob

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