Richard Chang 0002, Wang Jie, Namrata Thakur, Ramanpreet Singh Pahwa. AI-based 3D Metrology and Defect Detection of HBMs in XRM Scans. World Sci. Annu. Rev. Artif. Intell., 1, 2023. [doi]
@article{ChangJTP23,
title = {AI-based 3D Metrology and Defect Detection of HBMs in XRM Scans},
author = {Richard Chang 0002 and Wang Jie and Namrata Thakur and Ramanpreet Singh Pahwa},
year = {2023},
doi = {10.1142/S2811032324400022},
url = {https://doi.org/10.1142/S2811032324400022},
researchr = {https://researchr.org/publication/ChangJTP23},
cites = {0},
citedby = {0},
journal = {World Sci. Annu. Rev. Artif. Intell.},
volume = {1},
}