Prognostics-Based LED Qualification Using Similarity-Based Statistical Measure With RVM Regression Model

Moon-Hwan Chang, Myeongsu Kang, Michael G. Pecht. Prognostics-Based LED Qualification Using Similarity-Based Statistical Measure With RVM Regression Model. IEEE Transactions on Industrial Electronics, 64(7):5667-5677, 2017. [doi]

@article{ChangKP17,
  title = {Prognostics-Based LED Qualification Using Similarity-Based Statistical Measure With RVM Regression Model},
  author = {Moon-Hwan Chang and Myeongsu Kang and Michael G. Pecht},
  year = {2017},
  doi = {10.1109/TIE.2017.2677301},
  url = {https://doi.org/10.1109/TIE.2017.2677301},
  researchr = {https://researchr.org/publication/ChangKP17},
  cites = {0},
  citedby = {0},
  journal = {IEEE Transactions on Industrial Electronics},
  volume = {64},
  number = {7},
  pages = {5667-5677},
}