Prognostics-Based LED Qualification Using Similarity-Based Statistical Measure With RVM Regression Model

Moon-Hwan Chang, Myeongsu Kang, Michael G. Pecht. Prognostics-Based LED Qualification Using Similarity-Based Statistical Measure With RVM Regression Model. IEEE Transactions on Industrial Electronics, 64(7):5667-5677, 2017. [doi]

Abstract

Abstract is missing.