Yuh-Lin Chang, Daniel P. Lopresti. The Effects of Document Image Defects on Line Drawing Analysis Algorithms. In Proceedings of IAPR Workshop on Machine Vision Applications, MVA 1994, December 13-15, 1994, Kawasaki, Japan. pages 522-527, 1994. [doi]
@inproceedings{ChangL94:3,
title = {The Effects of Document Image Defects on Line Drawing Analysis Algorithms},
author = {Yuh-Lin Chang and Daniel P. Lopresti},
year = {1994},
url = {http://b2.cvl.iis.u-tokyo.ac.jp/mva/proceedings/CommemorativeDVD/1994/papers/1994522.pdf},
tags = {analysis},
researchr = {https://researchr.org/publication/ChangL94%3A3},
cites = {0},
citedby = {0},
pages = {522-527},
booktitle = {Proceedings of IAPR Workshop on Machine Vision Applications, MVA 1994, December 13-15, 1994, Kawasaki, Japan},
}