The Effects of Document Image Defects on Line Drawing Analysis Algorithms

Yuh-Lin Chang, Daniel P. Lopresti. The Effects of Document Image Defects on Line Drawing Analysis Algorithms. In Proceedings of IAPR Workshop on Machine Vision Applications, MVA 1994, December 13-15, 1994, Kawasaki, Japan. pages 522-527, 1994. [doi]

Abstract

Abstract is missing.