Ching-Pao Chang, Jia-Lyn Lv, Chih-Ping Chu. A Defect Estimation Approach for Sequential Inspection Using a Modified Capture-Recapture Model. In 29th Annual International Computer Software and Applications Conference (COMPSAC 2005), 25-28 July 2005, Edinburgh, Scotland, UK. pages 41-46, IEEE Computer Society, 2005. [doi]
Abstract is missing.