Yi-Ming Chang, Ti-Li Lin, Hung-Chun Chi, Wei-Kai Lin. Deep Learning-based AOI System for Detecting Component Marks. In Hyeran Byun, Beng Chin Ooi, Katsumi Tanaka, Sang-Won Lee 0001, Zhixu Li, Akiyo Nadamoto, Giltae Song, Young-Guk Ha, Kazutoshi Sumiya, Yuncheng Wu, Hyuk-Yoon Kwon, Takehiro Yamamoto, editors, IEEE International Conference on Big Data and Smart Computing, BigComp 2023, Jeju, Republic of Korea, February 13-16, 2023. pages 243-247, IEEE, 2023. [doi]
Abstract is missing.