Improving Fault Localization by Complex-Fault Oriented Higher-Order Mutant Generation

Zexing Chang, Yong Liu, Shumei Wu, Paul Doyle, Haifeng Wang, Xiang Chen 0005. Improving Fault Localization by Complex-Fault Oriented Higher-Order Mutant Generation. In Hossain Shahriar, Yuuichi Teranishi, Alfredo Cuzzocrea, Moushumi Sharmin, Dave Towey, A. K. M. Jahangir Alam Majumder, Hiroki Kashiwazaki, Ji-Jiang Yang, Michiharu Takemoto, Nazmus Sakib, Ryohei Banno, Sheikh Iqbal Ahamed, editors, 47th IEEE Annual Computers, Software, and Applications Conference, COMPSAC 2023, Torino, Italy, June 26-30, 2023. pages 1792-1797, IEEE, 2023. [doi]

Authors

Zexing Chang

This author has not been identified. Look up 'Zexing Chang' in Google

Yong Liu

This author has not been identified. Look up 'Yong Liu' in Google

Shumei Wu

This author has not been identified. Look up 'Shumei Wu' in Google

Paul Doyle

This author has not been identified. Look up 'Paul Doyle' in Google

Haifeng Wang

This author has not been identified. Look up 'Haifeng Wang' in Google

Xiang Chen 0005

This author has not been identified. Look up 'Xiang Chen 0005' in Google