Zexing Chang, Yong Liu, Shumei Wu, Paul Doyle, Haifeng Wang, Xiang Chen 0005. Improving Fault Localization by Complex-Fault Oriented Higher-Order Mutant Generation. In Hossain Shahriar, Yuuichi Teranishi, Alfredo Cuzzocrea, Moushumi Sharmin, Dave Towey, A. K. M. Jahangir Alam Majumder, Hiroki Kashiwazaki, Ji-Jiang Yang, Michiharu Takemoto, Nazmus Sakib, Ryohei Banno, Sheikh Iqbal Ahamed, editors, 47th IEEE Annual Computers, Software, and Applications Conference, COMPSAC 2023, Torino, Italy, June 26-30, 2023. pages 1792-1797, IEEE, 2023. [doi]
@inproceedings{ChangLWDWC23, title = {Improving Fault Localization by Complex-Fault Oriented Higher-Order Mutant Generation}, author = {Zexing Chang and Yong Liu and Shumei Wu and Paul Doyle and Haifeng Wang and Xiang Chen 0005}, year = {2023}, doi = {10.1109/COMPSAC57700.2023.00277}, url = {https://doi.org/10.1109/COMPSAC57700.2023.00277}, researchr = {https://researchr.org/publication/ChangLWDWC23}, cites = {0}, citedby = {0}, pages = {1792-1797}, booktitle = {47th IEEE Annual Computers, Software, and Applications Conference, COMPSAC 2023, Torino, Italy, June 26-30, 2023}, editor = {Hossain Shahriar and Yuuichi Teranishi and Alfredo Cuzzocrea and Moushumi Sharmin and Dave Towey and A. K. M. Jahangir Alam Majumder and Hiroki Kashiwazaki and Ji-Jiang Yang and Michiharu Takemoto and Nazmus Sakib and Ryohei Banno and Sheikh Iqbal Ahamed}, publisher = {IEEE}, isbn = {979-8-3503-2697-0}, }