Jen-Hao Rick Chang, Aswin C. Sankaranarayanan, B. V. K. Vijaya Kumar. Random Features for Sparse Signal Classification. In 2016 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2016, Las Vegas, NV, USA, June 27-30, 2016. pages 5404-5412, IEEE Computer Society, 2016. [doi]
Abstract is missing.