Low VDDmin Swing-Sample-and-Couple Sense Amplifier and Energy-Efficient Self-Boost-Write-Termination Scheme for Embedded ReRAM Macros Against Resistance and Switch-Time Variations

Meng-Fan Chang, Jui-Jen Wu, Tun-Fei Chien, Yen-Chen Liu, Ting-Chin Yang, Wen-Chao Shen, Ya-Chin King, Chrong Jung Lin, Ku-Feng Lin, Yu-Der Chih, Jonathan Chang. Low VDDmin Swing-Sample-and-Couple Sense Amplifier and Energy-Efficient Self-Boost-Write-Termination Scheme for Embedded ReRAM Macros Against Resistance and Switch-Time Variations. J. Solid-State Circuits, 50(11):2786-2795, 2015. [doi]

@article{ChangWCLYSKLLCC15,
  title = {Low VDDmin Swing-Sample-and-Couple Sense Amplifier and Energy-Efficient Self-Boost-Write-Termination Scheme for Embedded ReRAM Macros Against Resistance and Switch-Time Variations},
  author = {Meng-Fan Chang and Jui-Jen Wu and Tun-Fei Chien and Yen-Chen Liu and Ting-Chin Yang and Wen-Chao Shen and Ya-Chin King and Chrong Jung Lin and Ku-Feng Lin and Yu-Der Chih and Jonathan Chang},
  year = {2015},
  doi = {10.1109/JSSC.2015.2472601},
  url = {http://dx.doi.org/10.1109/JSSC.2015.2472601},
  researchr = {https://researchr.org/publication/ChangWCLYSKLLCC15},
  cites = {0},
  citedby = {0},
  journal = {J. Solid-State Circuits},
  volume = {50},
  number = {11},
  pages = {2786-2795},
}