A reliability enhancement design under the flash translation layer for MLC-based flash-memory storage systems

Yuan-Hao Chang, Ming-Chang Yang, Tei-Wei Kuo, Ren-Hung Hwang. A reliability enhancement design under the flash translation layer for MLC-based flash-memory storage systems. ACM Trans. Embedded Comput. Syst., 13(1):10, 2013. [doi]

Abstract

Abstract is missing.