Unknown-tolerance analysis and test-quality control for test response compaction using space compactors

Mango Chia-Tso Chao, Kwang-Ting Cheng, Seongmoon Wang, Srimat T. Chakradhar, Wenlong Wei. Unknown-tolerance analysis and test-quality control for test response compaction using space compactors. In Ellen Sentovich, editor, Proceedings of the 43rd Design Automation Conference, DAC 2006, San Francisco, CA, USA, July 24-28, 2006. pages 1083-1088, ACM, 2006. [doi]

Abstract

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