An accurate algorithm for computing mutation coverage in model checking

Huina Chao, Huawei Li, Tiancheng Wang, Xiaowei Li, Bo Liu. An accurate algorithm for computing mutation coverage in model checking. In 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. pages 1-10, IEEE, 2016. [doi]

Authors

Huina Chao

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Huawei Li

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Tiancheng Wang

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Xiaowei Li

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Bo Liu

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