Huina Chao, Huawei Li, Tiancheng Wang, Xiaowei Li, Bo Liu. An accurate algorithm for computing mutation coverage in model checking. In 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. pages 1-10, IEEE, 2016. [doi]
@inproceedings{ChaoLWLL16,
title = {An accurate algorithm for computing mutation coverage in model checking},
author = {Huina Chao and Huawei Li and Tiancheng Wang and Xiaowei Li and Bo Liu},
year = {2016},
doi = {10.1109/TEST.2016.7805864},
url = {http://dx.doi.org/10.1109/TEST.2016.7805864},
researchr = {https://researchr.org/publication/ChaoLWLL16},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016},
publisher = {IEEE},
isbn = {978-1-4673-8773-6},
}