Shin-Min Chao, Du-Ming Tsai, Wei-Chen Li, Wei-Yao Chiu. A Generalized Anisotropic Diffusion for Defect Detection in Low-Contrast Surfaces. In 20th International Conference on Pattern Recognition, ICPR 2010, Istanbul, Turkey, 23-26 August 2010. pages 4408-4411, IEEE, 2010. [doi]
Abstract is missing.