David Chaparro, Maria Piles, Mercè Vall-Llossera, Adriano Camps, Alexandra Georges Konings, Dara Entekhabi, Thomas Jagdhuber. L-Band Vegetation Optical Depth for Crop Phenology Monitoring and Crop Yield Assessment. In 2018 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2018, Valencia, Spain, July 22-27, 2018. pages 8225-8227, IEEE, 2018. [doi]
Abstract is missing.