Glenn H. Chapman, Vijay K. Jain. Defect Tolerance for a Capacitance Based Nanoscale Biosensor. In Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, Mohammad Tehranipoor, editors, 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA. pages 220-228, IEEE Computer Society, 2008. [doi]
@inproceedings{ChapmanJ08:0,
title = {Defect Tolerance for a Capacitance Based Nanoscale Biosensor},
author = {Glenn H. Chapman and Vijay K. Jain},
year = {2008},
doi = {10.1109/DFT.2008.45},
url = {http://dx.doi.org/10.1109/DFT.2008.45},
tags = {rule-based},
researchr = {https://researchr.org/publication/ChapmanJ08%3A0},
cites = {0},
citedby = {0},
pages = {220-228},
booktitle = {23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA},
editor = {Cristiana Bolchini and Yong-Bin Kim and Dimitris Gizopoulos and Mohammad Tehranipoor},
publisher = {IEEE Computer Society},
}