Glenn H. Chapman, Jenny Leung, Rahul Thomas, Zahava Koren, Israel Koren. Tradeoffs in imager design parameters for sensor reliability. In Ralf Widenhorn, Valérie Nguyen, editors, Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications XII, San Francisco Airport, California, USA, January 23-27, 2011. Volume 7875 of SPIE Proceedings, SPIE, 2011. [doi]
Abstract is missing.