Projecting the rate of in-field pixel defects based on pixel size, sensor area, and ISO - researchr publication authors

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Glenn H. Chapman, Jenny Leung, Rohit Thomas, Ana I. L. Namburete, Zahava Koren, Israel Koren. Projecting the rate of in-field pixel defects based on pixel size, sensor area, and ISO. In Ralf Widenhorn, Valérie Nguyen, Antoine Dupret, editors, Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII, Burlingame, California, USA, January 22-26, 2012. Volume 8298 of SPIE Proceedings, SPIE, 2012. [doi]

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