Glenn H. Chapman, Jenny Leung, Rohit Thomas, Ana I. L. Namburete, Zahava Koren, Israel Koren. Projecting the rate of in-field pixel defects based on pixel size, sensor area, and ISO. In Ralf Widenhorn, Valérie Nguyen, Antoine Dupret, editors, Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII, Burlingame, California, USA, January 22-26, 2012. Volume 8298 of SPIE Proceedings, SPIE, 2012. [doi]
@inproceedings{ChapmanLTNKK12,
title = {Projecting the rate of in-field pixel defects based on pixel size, sensor area, and ISO},
author = {Glenn H. Chapman and Jenny Leung and Rohit Thomas and Ana I. L. Namburete and Zahava Koren and Israel Koren},
year = {2012},
doi = {10.1117/12.910096},
url = {https://doi.org/10.1117/12.910096},
researchr = {https://researchr.org/publication/ChapmanLTNKK12},
cites = {0},
citedby = {0},
booktitle = {Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII, Burlingame, California, USA, January 22-26, 2012},
editor = {Ralf Widenhorn and Valérie Nguyen and Antoine Dupret},
volume = {8298},
series = {SPIE Proceedings},
publisher = {SPIE},
isbn = {9780819489456},
}