Glenn H. Chapman, Simone Neufeld, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren, Coelho Silva Meneses. Dependence of SEUs in Digital Cameras on Pixel size and Elevation. In Luigi Dilillo, Luca Cassano, Athanasios Papadimitriou, editors, 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021. pages 1-4, IEEE, 2021. [doi]
@inproceedings{ChapmanNMKKM21,
title = {Dependence of SEUs in Digital Cameras on Pixel size and Elevation},
author = {Glenn H. Chapman and Simone Neufeld and Klinsmann J. Coelho Silva Meneses and Israel Koren and Zahava Koren and Coelho Silva Meneses},
year = {2021},
doi = {10.1109/DFT52944.2021.9568337},
url = {https://doi.org/10.1109/DFT52944.2021.9568337},
researchr = {https://researchr.org/publication/ChapmanNMKKM21},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021},
editor = {Luigi Dilillo and Luca Cassano and Athanasios Papadimitriou},
publisher = {IEEE},
isbn = {978-1-6654-1609-2},
}