Benoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois. Generation of Electrically Induced Stimuli for MEMS Self-Test. J. Electronic Testing, 17(6):459-470, 2001. [doi]
@article{CharlotMPC01:0,
title = {Generation of Electrically Induced Stimuli for MEMS Self-Test},
author = {Benoît Charlot and Salvador Mir and Fabien Parrain and Bernard Courtois},
year = {2001},
doi = {10.1023/A:1012860420235},
url = {http://dx.doi.org/10.1023/A:1012860420235},
tags = {testing},
researchr = {https://researchr.org/publication/CharlotMPC01%3A0},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {17},
number = {6},
pages = {459-470},
}