Mitrajit Chatterjee, Dhiraj K. Pradhan. A novel pattern generator for near-perfect fault-coverage. In 13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA. pages 417-425, IEEE Computer Society, 1995. [doi]
@inproceedings{ChatterjeeP95,
title = {A novel pattern generator for near-perfect fault-coverage},
author = {Mitrajit Chatterjee and Dhiraj K. Pradhan},
year = {1995},
url = {http://csdl.computer.org/comp/proceedings/vts/1995/7000/00/70000417abs.htm},
tags = {coverage},
researchr = {https://researchr.org/publication/ChatterjeeP95},
cites = {0},
citedby = {0},
pages = {417-425},
booktitle = {13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA},
publisher = {IEEE Computer Society},
}