Subrata Chattopadhyay, Shiv Bhushan Tripathi, Mrinal Goswami, Bibhash Sen. Design of fault tolerant majority voter for TMR circuit in QCA. In 20th International Symposium on VLSI Design and Test, VDAT 2016, Guwahati, India, May 24-27, 2016. pages 1-2, IEEE, 2016. [doi]
@inproceedings{ChattopadhyayTG16,
title = {Design of fault tolerant majority voter for TMR circuit in QCA},
author = {Subrata Chattopadhyay and Shiv Bhushan Tripathi and Mrinal Goswami and Bibhash Sen},
year = {2016},
doi = {10.1109/ISVDAT.2016.8064905},
url = {https://doi.org/10.1109/ISVDAT.2016.8064905},
researchr = {https://researchr.org/publication/ChattopadhyayTG16},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {20th International Symposium on VLSI Design and Test, VDAT 2016, Guwahati, India, May 24-27, 2016},
publisher = {IEEE},
isbn = {978-1-5090-1422-4},
}