Mayank Chaturvedi, Sima Dimitrijev, Hamid Amini Moghadam, Daniel Haasmann, Peyush Pande, Utkarsh Jadli. Fast Near-Interface Traps in 4H-SiC MOS Capacitors Measured by an Integrated-Charge Method. IEEE Access, 9:109745-109753, 2021. [doi]
Abstract is missing.