Savio N. Chau. Fault injection scan design for enhanced VLSI design verification. In 11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA. pages 109-111, IEEE, 1993. [doi]
@inproceedings{Chau93-0, title = {Fault injection scan design for enhanced VLSI design verification}, author = {Savio N. Chau}, year = {1993}, doi = {10.1109/VTEST.1993.313299}, url = {http://dx.doi.org/10.1109/VTEST.1993.313299}, researchr = {https://researchr.org/publication/Chau93-0}, cites = {0}, citedby = {0}, pages = {109-111}, booktitle = {11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA}, publisher = {IEEE}, isbn = {0-8186-3830-3}, }