Sarthak Prakash Chaudhari, Jani Babu Shaik, Sonal Singhal, Nilesh Goel. Correlation of Dynamic and Static Metrics of SRAM Cell under Time-Zero Variability and After NBTI Degradation. In IEEE International Symposium on Smart Electronic Systems, iSES 2018 (Formerly iNiS), Hyderabad, India, December 17-19, 2018. pages 90-93, IEEE, 2018. [doi]
Abstract is missing.