Time dependent variability in RMG-HKMG FinFETs: Impact of extraction scheme on stochastic NBTI - researchr publication authors

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A. Chaudhary, Ben Kaczer, Philippe J. Roussel, Thomas Chiarella, Naoto Horiguchi, S. Mahapatra. Time dependent variability in RMG-HKMG FinFETs: Impact of extraction scheme on stochastic NBTI. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 3, IEEE, 2015. [doi]

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