S. Mahapatra - researchr alias

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Viewing Publication 1 - 22 from 22

2025

Modeling BTI Reliability in CMOS DRAM Periphery Device: A Review of BTI Analysis Tool (BAT)A. Subirats, M. Samiee, G. Ferrari, U. Sharma, T. Imamoto, M. Yokomichi, S. Srivastava, K. Florent, T. Owens, A. S. Bisht, S. Mahapatra. irps 2025: 1-6 [doi]

2020

Hot Carrier Degradation in Cryo-CMOSW. Chakraborty, U. Sharma, S. Datta, S. Mahapatra. irps 2020: 1-5 [doi]

A Monte-Carlo Markov chain approach for coverage-area reliability of mobile wireless sensor networks with multistate nodesSuparna Chakraborty, Neeraj Kumar Goyal, S. Mahapatra, Sieteng Soh. ress, 193:106662, 2020. [doi]

2018

2015

Time dependent variability in RMG-HKMG FinFETs: Impact of extraction scheme on stochastic NBTIA. Chaudhary, Ben Kaczer, Philippe J. Roussel, Thomas Chiarella, Naoto Horiguchi, S. Mahapatra. irps 2015: 3 [doi]

Impact of time-zero and NBTI variability on sub-20nm FinFET based SRAM at low voltagesN. Goel, P. Dubey, J. Kawa, S. Mahapatra. irps 2015: 5 [doi]

2014

A comprehensive modeling framework for gate stack process dependence of DC and AC NBTI in SiON and HKMG p-MOSFETsN. Goel, K. Joshi, S. Mukhopadhyay, N. Nanaware, S. Mahapatra. mr, 54(3):491-519, 2014. [doi]

2007

2006

Design and Evaluation of a Distributed Diagnosis Algorithm in Dynamic Fault Environments For Not-Completely Connected NetworkPabitra Mohan Khilar, S. Mahapatra. IEEEcit 2006: 81-82 [doi]

The Jahn-Teller and pseudo-Jahn-Teller effects in the anion photoelectron spectroscopy of B3 clusterT. S. Venkatesan, K. Deepika, S. Mahapatra. jcc, 27(10):1093-1100, 2006. [doi]

2005

A comprehensive model of PMOS NBTI degradationM. A. Alam, S. Mahapatra. mr, 45(1):71-81, 2005. [doi]

Invariance image analysis using modified Zernike momentsN. K. Kamila, S. Mahapatra, S. Nanda. prl, 26(6):747-753, 2005. [doi]

A Parallel Scheme for Implementing Multialphabet Arithmetic Coding in High-Speed Programmable HardwareS. Mahapatra, Kuldeep Singh. itcc 2005: 79-84 [doi]

2003

Substrate Bias Effect on Cycling Induced Performance Degradation of Flash EEPROMsS. Mahapatra, S. Shukuri, Jeff Bude. vlsid 2003: 223-226 [doi]

2001

Multi-frequency transconductance technique for interface characterization of deep sub-micron SOI-MOSFETsA. Kumar, S. Mahapatra, R. Lal, V. Ramgopal Rao. mr, 41(7):1049-1051, 2001. [doi]

erformance Optimization Of 60 Nm Channel Length Vertical Mosfets Using Channel EngineeringG. Shrivastav, S. Mahapatra, V. Ramgopal Rao, J. Vasi, K. G. Anil, C. Fink, Walter Hansch, I. Eisele. vlsid 2001: 475-478 [doi]

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