Multi-frequency transconductance technique for interface characterization of deep sub-micron SOI-MOSFETs

A. Kumar, S. Mahapatra, R. Lal, V. Ramgopal Rao. Multi-frequency transconductance technique for interface characterization of deep sub-micron SOI-MOSFETs. Microelectronics Reliability, 41(7):1049-1051, 2001. [doi]

Abstract

Abstract is missing.