Multi-frequency transconductance technique for interface characterization of deep sub-micron SOI-MOSFETs - researchr publication authors

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A. Kumar, S. Mahapatra, R. Lal, V. Ramgopal Rao. Multi-frequency transconductance technique for interface characterization of deep sub-micron SOI-MOSFETs. Microelectronics Reliability, 41(7):1049-1051, 2001. [doi]

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