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Paul Pfäffli, H. Y. Wong, X. Xu, L. Silvestri, X. W. Lin, T. Yang, Ravi Tiwari, S. Mahapatra, S. Motzny, V. Moroz, T. Ma. TCAD modeling for reliability. Microelectronics Reliability, 88:1083-1089, 2018. [doi]
Abstract is missing.