Built-in Self-Test and Fault Localization for Inter-Layer Vias in Monolithic 3D ICs

Arjun Chaudhuri, Sanmitra Banerjee, Jinwoo Kim, Heechun Park, Bon Woong Ku, Sukeshwar Kannan, Krishnendu Chakrabarty, Sung Kyu Lim. Built-in Self-Test and Fault Localization for Inter-Layer Vias in Monolithic 3D ICs. JETC, 18(1), 2022. [doi]

Abstract

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