Arjun Chaudhuri, Ching-Yuan Chen, Jonti Talukdar, Krishnendu Chakrabarty. ∗. In 41st IEEE VLSI Test Symposium, VTS 2023, San Diego, CA, USA, April 24-26, 2023. pages 1-6, IEEE, 2023. [doi]
@inproceedings{ChaudhuriCTC23,
title = {∗},
author = {Arjun Chaudhuri and Ching-Yuan Chen and Jonti Talukdar and Krishnendu Chakrabarty},
year = {2023},
doi = {10.1109/VTS56346.2023.10139981},
url = {https://doi.org/10.1109/VTS56346.2023.10139981},
researchr = {https://researchr.org/publication/ChaudhuriCTC23},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {41st IEEE VLSI Test Symposium, VTS 2023, San Diego, CA, USA, April 24-26, 2023},
publisher = {IEEE},
isbn = {979-8-3503-4630-5},
}