Study of dielectric material property impact on insertion loss for advanced packaging solutions

Bok Eng Cheah, H. Louis Lo, Jackson Kong. Study of dielectric material property impact on insertion loss for advanced packaging solutions. In IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2015, Taipei, Taiwan, June 6-8, 2015. pages 134-135, IEEE, 2015. [doi]

Abstract

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